Structure of thin layers and nanoparticles ****************************************************************************************** * Structure of thin layers and nanoparticles ****************************************************************************************** We use a broad range of x?ray?based methods, such as x?ray diffraction, x?ray scattering a spectroscopy for the study of various types of nanostructures. In the last decade we have semiconductor and metallic nanoparticles and quantum dots in single?crystalline and amorph We have investigated the structure of these objects by x?ray diffraction, small?angle x?ra and x?ray absorption spectroscopy (methods EXAFS and XANES). We are also studying defects epitaxial layers by reciprocal?space mapping method and by numerical simulations based on approach. Quite recently we have started a study of the structure of new materials, like antiferroma semiconductor layers and topological insulators. We perform the experiments in the x?ray l Department of Condensed Matter physics, however we are frequently using various synchrotro (Grenoble), ANKA (Karlsruhe) and ELETTRA (Trieste). ****************************************************************************************** * Selected outputs ****************************************************************************************** • J. Růžička, O. Caha, V. Holý, H. Steiner, V. Volobuiev, A. Ney, G. Bauer, T. Duchoň, K. I. Khalakhan, V. Matolín, E. F. Schwier, H. Iwasawa, K. Shimada, and G. Springholz: Stru electronic properties of manganese-doped Bi2Te3 epitaxial layers. New J. Phys. 17, 01302 • J. Šmilauerová, P. Harcuba, J. Stráský, J. Stráská, M. Janeček, J. Pospíšil, R. Kužel, T Holý, and J. Ilavský: Ordered array of omega particles in beta-Ti matrix studied by smal scattering. Acta Mater. 81, 71-82 (2014). • M. Barchuk, V. Holý, D. Kriegner, J. Stangl, S. Schwaiger, and F. Scholz: Diffuse x-ray stacking faults in a-plane GaN epitaxial layers. Phys. Rev. B 84, 094113 (2011).